Xie Jie-cheng;Zhang Da-li;Xu Wen-li
Gao Yongying; Zhang Yujin; Luo Yun
© 2010 JOURNAL OF ELECTRONICS & INFORMATION TECHNOLOGY Institute of Electronics, Chinese Academy of Sciences, P.O.Box 2702, Beijing 100190 Tel: +86-10-58887066 Fax: +86-10- 58887539,Email: jeit@mail.ie.ac.cn