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Optimal selection of interferometric SAR phase fringe image with residue |
Tao Kun; Yang Ruliang |
The Institute of Electronics Chinese Academy of Sciences Beijing 100080 China |
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Abstract In this paper, the intrinsic relationship between registration accuracy and probability of residues referred to in phase unwrapping is investigated. Based on the derived model, it is presented that the number of residues can be used as a criterion to judge the registration results and select the optimal phase fringe image, which will reduce the error caused by misregistration as possible as much. The experiments show the effectiveness of this approach.
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Received: 22 April 2002
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