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| USING THE GENETIC ALGORITHMS TO SOLVE THE PROBLEM OF OPTIMAL SPARE ALLOCATION FOR FAULT-TOLERANT VLSI |
| Zhao Tianxu; Hao Yue; Zhou Shuisheng |
| Research Inst. of Microelectronics Xidian University Xi' an 710071 China |
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Abstract An increase in chip area and circuit complexity leads to a reduction in the yield of production. In order to solve the problem of low yield by defects in process of large scale integrated circuits manufacture, the fault-tolerant technique is introduced into the integrated circuits design. A system must be provided with a certain quantity of spare elements to have the ability of fault-tolerance. In this paper, the problem of optimal spare allocation for fault-tolerant VLSI is solved effectively by means of genetic algorithm.
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Received: 09 May 1999
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2001, Vol. 23 
