电子与信息学报
   
  
   Home  |  About Journal  |  Ethics Statement  |  Editorial Board  |  Instruction  |  Subscriptions  |  Contacts Us  |  Message  |  Chinese
电子与信息学报
OFFICE ONLINE
 ·Author Center
 ·Peer Review
 ·Editor Work
 ·Office Work
 ·Editor-in-chief
 
JOURNAL
 ·Forthcoming Articles
 ·Current Issue
 ·Next Issue
 ·Archive
 ·Advanced Search
 ·Archive By Volume
 ·Archive By Subject
 ·Email Alert
 ·
 
Hot Paper
 ·Top Cited
 ·TOP Read Articles
 ·TOP Download Articles
 
Other articles related with "TN32":
661 Liu Weidong;Wei Tongli
  ANALYTICAL INVESTIGATION OF LOW-TEMPERATURE HOT-CARRIER NMOSFET S
    JEIT   1996 Vol.18 (6): 661-665 [Abstract] (1654) [HTML 1 KB] [PDF 813 KB] (519)
397 Hao Yue; Liu Zhijing
  THE CORRELATIVE EXTRACTION METHOD FOR BJT DYNAMIC MODEL PARAMETERS
    JEIT   1996 Vol.18 (4): 397-400 [Abstract] (1518) [HTML 1 KB] [PDF 596 KB] (470)
194 Li Yao; Zheng Jiang; Shen Keqiang; Wei Tongli
  ANALYSIS OF DC CHARACTERISTICS OF ECL CIRCUIT AT LOW TEMPERATURE
    JEIT   1996 Vol.18 (2): 194-201 [Abstract] (1522) [HTML 1 KB] [PDF 1270 KB] (504)
First page | Prev page | Next page | Last pagePage 1 of 1, 3 records
     京ICP备05002787号

© 2010 JOURNAL OF ELECTRONICS & INFORMATION TECHNOLOGY
Institute of Electronics, Chinese Academy of Sciences, P.O.Box 2702, Beijing 100190
Tel: +86-10-58887066 Fax: +86-10- 58887539,Email: jeit@mail.ie.ac.cn

Supported by:Beijing Magtech