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Bias, Variance and Risk Analysis of Uniform Threshod Function in Wavelet Shrinkage |
Zhao Zhi-dong; Pan Min; Chen Yu-quan |
Department of Biomedical Engineering and Instruments Zhejiang University Hangzhou 310027 China |
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Abstract In this paper, the uniform threshold function of waveshrink is build.Cornputationally efficient formulas for computing bias, variance and risk of uniform threshold function are derived. These formulas provide a new way of understanding how waveshrink works. On the basis of this, the relation of bias, variance and risk of uniform threshold function(u=l,2,∞) with threshold value and wavelet coefficients are compared. These comparisons give the performance of waveshrink in finite sample situations.
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Received: 09 October 2003
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