电子与信息学报
   
  
   Home  |  About Journal  |  Ethics Statement  |  Editorial Board  |  Instruction  |  Subscriptions  |  Contacts Us  |  Message  |  Chinese
  2005, Vol. 27 Issue (5): 717-721     DOI:
Articles Current Issue| Next Issue| Archive| Adv Search |
Research of SVM-Based Edge Detection Algorithm Optimization
Zheng Sheng; Liu Jian; Tiari Jin-wen
State Education Commission Key Laboratory for Image Processing and Intelligent Control, Inst. for Patt. Recog. and Artif. Intel., Huazhong Univ. of Sci. and Tech., Wuhan 430074 China

     京ICP备05002787号

© 2010 JOURNAL OF ELECTRONICS & INFORMATION TECHNOLOGY
Institute of Electronics, Chinese Academy of Sciences, P.O.Box 2702, Beijing 100190
Tel: +86-10-58887066 Fax: +86-10- 58887539,Email: jeit@mail.ie.ac.cn

Supported by:Beijing Magtech