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| Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm |
| Xu Chuan-pei①②; Li Zhi①; Mo Wei① |
| ①Dept. of Electronic Engineering, Guilin University of Electronic Technology, Guilin 541004, China;②School of Mechano-Electronic Engineering, Xidian University, Xi’an 710071,China |
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Abstract This paper presents a new test pattern generation technique based on ant algorithm and genetic algorithm for improving the test generation efficiency for sequential circuits. Experimental results for the sequential benchmark circuits show that the hybrid approach not only takes full advantage of utilizing both algorithms, but also overcomes their disadvantages. It can achieve higher fault coverages and more compact test sets when compared to other similar test generation algorithms, demonstrating the combined algorithm is a successful algorithm.
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Received: 09 February 2004
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2005, Vol. 27 
