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| A New Method for Image Registration Based on Alignment Metric of Feature Points |
| Ge Yong-xin①; Yang Dan②; Zhang Xiao-hong② |
| ①College of Mathematics & Physics, Chongqing University, Chongqing 400044, China; ②Faculty of Software Engineering, Chongqing University, Chongqing 400044, China |
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Abstract A new matching metric——alignment metric of feature points is defined, and a new approach to image registration based on alignment metric of feature points is proposed. Feature points and their angles are detected by using wavelet multi-scale product, then the alignment metric of all feature points are calculated, so matching points can be obtained. The experimental results illustrate the algorithm has a good performance of accuracy and efficiency.
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Received: 26 July 2005
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2007, Vol. 29 
