基于DOA和TDOI的主瓣扫描辐射源定位方法

doi:10.11999/JEIT170141

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Abstract The determination of the scanning emitter position with known scan rate using Direction Of Arrival (DOA) and Time Difference Of Interception (TDOI) is investigated. The Cramér-Rao Lower Bound (CRLB) of the DOA and TDOI based localization regime is firstly derived. It demonstrates that the equivalent DOA measurements noise power ratio of the individual regime is closely related to the improvement of the combination regime. To exclusively determine the position of the scanning emitter, the TOI measurements are transformed to the corresponding DOA measurements and then a Weighted Pseudo-linear Least Square (WPLS) estimator is proposed. However, the WPLS is biased due to the noise correlation between the regressor and regressand of the pseudo-linear equation. The Instrumental Variable (IV) method is resorted to eliminate the bias caused by the WPLS, and a Weighted IV (WIV) estimator, at the cost of two times computational complexity of the WPLS, is proposed. Simulations show that the WIV performs approximately to the Maximum Likelihood (ML) estimator. It can reach the CRLB in one scan cycle, and is asymptotic unbiased within multiple cycles.

Key words： Passive localization Mechanical scanning Direction Of Arrival (DOA) Time Difference Of Interception (TDOI) Least Squares (LS)

Received: 21 February 2017 Published: 01 November 2017

PACS:

TN971

Fund:Shanghai Aerospace Science and Technology Innovation Fund (SAST2015028)

Corresponding Authors: ZHANG Min E-mail: zhangmin1984@126.com

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	ZHANG Yifei
	ZHANG Min
	GUO Fucheng

Cite this article:

ZHANG Yifei,ZHANG Min,GUO Fucheng. Scanning Emitter Localization Using DOA and TDOI Measurements[J]. JEIT, 2017, 39(12): 2921-2928.

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http://jeit.ie.ac.cn/EN/10.11999/JEIT170141 OR http://jeit.ie.ac.cn/EN/Y2017/V39/I12/2921

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