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| Fault-tolerant Analysis for Feedback Based Digital Circuit via Probabilistic CMOS Model |
| LI Yan HU Jianhao YANG Zeguo |
| (National Key Laboratory of Science and Technology on Communications, University of Electronic Science and Technology of China, Chengdu 611731, China) |
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Abstract Feedback structure is an efficient topology for noise-reducing in analog circuit while the cyclic circuit is widely used in digital circuit only for sequential circuit design due to its data-keeping property. However, few works study the reliability of the feedback structure for combinational circuits especially for the low power application. Many researchers pay their attentions to Markov Random Field (MRF) theory based circuits, which can operate in ultra-low supply voltage with high noise-immune. However, the MRF based circuit design methodology has a lack of the proof of the final feedback structures. Thus the reliability of MRF based feedback structures is not explained clearly. This paper uses the probabilistic CMOS model to analysis the NAND-NAND based feedback structure. The probability boundedness and increasing monotonicity properties of feedback structure are proved. Besides, it is proved that the feedback structure of MRF can achieve higher probability than the traditional design. In measurement, the result can support of proof and analysis.
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Received: 17 October 2016
Published: 14 April 2017
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| Fund: The National Natural Science Foundation of China (61371104) |
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Corresponding Authors:
LI Yan
E-mail: yanli1990.uestc@gmail.com
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