基于65 nm工艺的多端口可配置PUF电路设计

doi:10.11999/JEIT150968

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Abstract

Physical Unclonable Functions (PUF) exploits process variation across the same structure circuits during the manufacturing processes to generate numerous unique, random and unclonable security keys. In this paper, a multi-port configurable PUF scheme is proposed, which is based on random deviation of current mirrors. It consists of input register, deviation-voltage source, multiplexing-net, arbiter array and obfuscation circuit. After configuring deviation-voltage source by applying different input challenges, the PUF circuit updates keys without physically replacement, and it can generate multi-bit keys in a clock cycle. In SMIC 65 nm CMOS technology, the layout of 36 ports configurable PUF occupies 24.8 μm×77.4 μm with custom designing. Experimental results show that the PUF circuit possesses better statistical characteristic of uniqueness and randomness, and it has a high reliability of 97.4% with respect to temperature variation from ?40 °C to 125 °C, and supply voltage variation from 1.08 V to 1.32 V. It can be effectively used in information security field.

Key words： Circuit design Physical Unclonable Function (PUF) Multi-port Configurable

Received: 24 August 2015 Published: 14 March 2016

PACS:

TP331

Fund:

The National Natural Science Foundation of China (61474068, 61274132), The Natural Science Foundation of Zhejiang Provice (LQ14F040001), The Project of Department of Education of Zhejiang Provice (Y201430798)

Corresponding Authors: WANG Pengjun E-mail: wangpengjun@nbu.edu.cn

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	LI Gang
	WANG Pengjun
	ZHANG Yuejun
	QIAN Haoyu

Cite this article:

LI Gang,WANG Pengjun,ZHANG Yuejun等. Design of Multi-port Configurable PUF Circuit Based on 65 nm Technology[J]. JEIT, 2016, 38(6): 1541-1546.

URL:

http://jeit.ie.ac.cn/EN/10.11999/JEIT150968 OR http://jeit.ie.ac.cn/EN/Y2016/V38/I6/1541

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