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  2015, Vol. 37 Issue (1): 130-136    DOI: 10.11999/JEIT140119
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Saliency Detected Model Based on Selective Edges Prior
Jiang Yu-wen①②    Tan Le-yi②③    Wang Shou-jue①②
(Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China)
(Suzhou Institute of Nano-Tech and Nano-Biotics, Chinese Academy of Sciences, Suzhou 215123, China)
(College of Electronics and Information Engineering, Tongji University, Shanghai 200092, China)

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