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  2011, Vol. 33 Issue (6): 1520-1524    DOI: 10.3724/SP.J.1146.2011.00011
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Multi-fault Diagnosis for Wide-deviation Analog Circuits Based on ELVQ Algorithm
Xu Chong-bin①    Zhao Zhi-wen①②    Zheng Hui-fang
(School of Information, Beijing Normal University, Beijing 100875, China)
(Key Lab of Inertial Technology for National Defense, Beihang University, Beijing 100191, China)
(Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China)

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