多状态反射计技术

电子与信息学报


	Home \| About Journal \| Ethics Statement \| Editorial Board \| Instruction \| Subscriptions \| Contacts Us \| Message \| Chinese

1986, Vol. 8

Issue (1): 38-44 DOI:

Articles

Current Issue| Next Issue| Archive| Adv Search

|

MULTISTATE REPLECTOMETER

Xu Jiadong

Department of Electronic Engineering Northwestern Polytechnical University

Abstract
Figure/Table
References
Related Citation (15)

Download: PDF (1000 KB)
Export: BibTeX | EndNote (RIS)

Abstract A detail discussion on multistate technique and a comparison of it with the multiport technique are given. The relation between output powers and reflection of the device under test is shown. An experjmental millimeterwave multistate reflectometer is given and its measuring nesults are satisfactory.

Received: 21 May 1984

	Service

	E-mail this article
	Add to my bookshelf
	Add to citation manager
	E-mail Alert
	RSS
	Articles by authors

	Xu Jiadong

Cite this article:

Xu Jiadong. MULTISTATE REPLECTOMETER[J]. , 1986, 8(1): 38-44 .

URL:

http://jeit.ie.ac.cn/EN/ OR http://jeit.ie.ac.cn/EN/Y1986/V8/I1/38

京ICP备05002787号

© 2010 JOURNAL OF ELECTRONICS & INFORMATION TECHNOLOGY
Institute of Electronics, Chinese Academy of Sciences, P.O.Box 2702, Beijing 100190
Tel: +86-10-58887066　Fax: +86-10- 58887539,Email: jeit@mail.ie.ac.cn

Supported by:Beijing Magtech