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| A SCANNING LOW ENERGY ELECTRON PROBE FOR MEASURING THE SECONDARY EMISSION OF THERMIONIC CATHODES |
| Yang Lingyun; Mao Duli |
| Institute of Electronics Acadcmia Sintca |
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Abstract For this probe, the beam spot diameter of the primary electron beam is 50-100μm, the primary beam current is lower than 10-7A, and the energy of the primary electron (Ep) can be varied from 200 eV to 3 keV.By use of this probe, the secondary emission coefficient (δ) versus Eq curve and the secondary emission distribution over the cathode surface can be measured, and the secondary emission image of the cathodes can also be displayed. Finally, the secondary emission of the pure nikel sample and impregnated dispenser cathode are measured.
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Received: 14 June 1985
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1987, Vol. 9 
