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| 1-D RHT Method Based on Symmetry Point Searching for Ellipse Detection |
| Yu Hai-bin; Liu Jing-biao; Liu Yuan-yuan |
| School of Electronic & Information, Hangzhou Dianzi University, Hangzhou 310018, China |
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Abstract To lower the high requirements of both the accuracy of the edge gradient and the integrity of the ellipse, a fast ellipse detection method using only 1-D accumulation array in parameter space based on symmetry points searching is presented to effectively extract multiple unknown ellipses in an image. Three undetermined parameters of the candidate ellipse are determined by the group of the symmetry points which are acquired by random sampling and the validation algorithm based on the ellipse generation and dilation matching is introduced to eliminate the effect of the ellipses’ distortion on the validation of the candidate ellipses. The experimental results show that compared with the other typical ellipse detection method based on RHT, the method here has the advantage of higher detection speed and accuracy and strong resistance to ellipse’s partial deletion and distortion.
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Received: 22 September 2008
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2009, Vol. 31 
