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ζ-TESTABILITY FOR k-FAULTS DIAGNOSIS |
Zhang Zhiyong; Yang Zuying |
Institute of Automation, Fuzhou University, Fuzhou 350002 |
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Abstract Using perturbation theories and a distance in manifolds, this paper initiates a testability condition for k-faults diagnosis in analog circuits with tolerance. In this condition, this paper mathematically elaborates how testability of a circuit with tolerance depends on both nominal data and measurable signals of the circuit. In addition, it is shown that this condition provides a theoretical basis for reasonably application of extreme methods to locate faults.
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Received: 18 October 1993
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