砷化镓共面波导内部微波信号的电光取样检测

Download: PDF (686 KB)
Export: BibTeX | EndNote (RIS)

Abstract A coaxial reflection-mode electrooptic sampling system is presented. This system has a temporal resolution less than 20 ps and a spatial resolution less than 3μm. The internal microwave signals in GaAs coplanar waveguides have been probed by the system. This system will be apply to on-wafer tests of internal characters of GaAs high-speed integrated circuits.

Key words： Electrooptic sampling High-speed integrated circuits Coplanar waveguides On-wafer tests Picosecond optical pulses

Received: 14 September 1993

PACS:

TN252

	Service

	E-mail this article
	Add to my bookshelf
	Add to citation manager
	E-mail Alert
	RSS
	Articles by authors








	Jia Gang
	Yi Maobin
	Sun Wei
	Cao Jie
	Sun Jianguo
	Wang Jiasheng
	Qin Li
	Gao Dingsan

Cite this article:

Jia Gang,Yi Maobin,Sun Wei等. ELECTROOPTIC SIMPLING OF INTERNAL MICROWAVE SIGNALS IN GaAsCOPLANAR WAVEGUIDES[J]. , 1995, 17(2): 197-200 .

URL:

http://jeit.ie.ac.cn/EN/ OR http://jeit.ie.ac.cn/EN/Y1995/V17/I2/197

[1]	Chai Wen-wen^①②; Zhang Xiao-juan^①. Characteristics and Applications of Several Coplanar Waveguide Feeding Devices[J]. , 2008, 30(1): 241-244 .