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Study on grid emission of microwave power tubes |
Wang Xiaoxia①; Liao Xianheng①; Zhao Qinglan①; Yu Xiaojun②; Zhang Jizhong② |
①Institute of Electronics Chinese Acadimy of Sciences Beijing 100080 China;②Dept. of Materials Sci. and Eng.,Tsinghua University Beijing 100084 China |
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Abstract Hf film is coated on the surface of Mo-grids by vacuum ion beam aided deposition technology. The SEM, XRD and RBS analyses are performed on modified Mo-grids. Life-span tests of this modified Mo-grid are carried out by diode experiment. When the temperature of the modified Mo-grids is kept at 650 ℃, the modified Mo-grids’ electron emission can not be detected with microammeter after 1000h life-span. The experimental results show that after the grid is contaminated by electron emission substance Ba of the cathode Hf formed compounds restrain effectively electron emission of grid.
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Received: 19 March 2001
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