Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm
Xu Chuan-pei①②; Li Zhi①; Mo Wei①
①Dept. of Electronic Engineering, Guilin University of Electronic Technology, Guilin 541004, China;②School of Mechano-Electronic Engineering, Xidian University, Xi’an 710071,China
Abstract：This paper presents a new test pattern generation technique based on ant algorithm and genetic algorithm for improving the test generation efficiency for sequential circuits. Experimental results for the sequential benchmark circuits show that the hybrid approach not only takes full advantage of utilizing both algorithms, but also overcomes their disadvantages. It can achieve higher fault coverages and more compact test sets when compared to other similar test generation algorithms, demonstrating the combined algorithm is a successful algorithm.
许川佩;李智; 莫玮. 基于蚂蚁算法和遗传算法的时序电路测试生成[J]. 电子与信息学报, 2005, 27(7): 1157-1161 .
Xu Chuan-pei①②; Li Zhi①; Mo Wei① . Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm. , 2005, 27(7): 1157-1161 .
2005, Vol. 27 
