Abstract:A new matching metric——alignment metric of feature points is defined, and a new approach to image registration based on alignment metric of feature points is proposed. Feature points and their angles are detected by using wavelet multi-scale product, then the alignment metric of all feature points are calculated, so matching points can be obtained. The experimental results illustrate the algorithm has a good performance of accuracy and efficiency.
葛永新; 杨丹; 张小洪. 基于特征点对齐度的图像配准方法[J]. 电子与信息学报, 2007, 29(2): 425-428 .
Ge Yong-xin; Yang Dan; Zhang Xiao-hong. A New Method for Image Registration Based on Alignment Metric of Feature Points. , 2007, 29(2): 425-428 .