Bias Temperature Instability-aware Soft Error Rate Analysis
WANG Zhen①② JIANG Jianhui② CHEN Naijin③
①(School of Computer Science and Technology, Shanghai University of Electric Power, Shanghai 200090, China) ②(School of Software Engineering, Tongji University, Shanghai 201804, China) ③(School of Computer and Information Science, Anhui Polytechnic University, Wuhu 241000, China)
Under nano-scaled technology, the Integrated Circuit (IC) reliability issues caused by both aging mechanism and soft error become very critical. In this paper, from critical charge and delay points of view, the effects of Bias Temperature Instability (BTI), including Negative BTI (NBTI) and Positive BTI (PBTI), on Soft Error Rate (SER) are analyzed. Firstly, how BTI affects critical charge and delay is focused on. The delay increasing model is derived, and the critical charge changing procedure is introduced. Further, using the derived SER computational model considering critical charge, and mapping the changed delay into electrical mask procedure, the SER is accurately calculated. Experimental results on ISCAS89 benchmark circuits show that, considering two factors of BTI, SER estimation has high accuracy.
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