Study of the Reliability of the Output Structure for X-band Space Traveling Wave Tube
SHANG Xinwen①②③ LI Xinwei①②③ CAO Linlin①② XIAO Liu①② SU Xiaobao①②
①(Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China) ②(Key Laboratory of High Power Micriwave Sources and Technology, Chinese Academy of Sciences, Beijing 101400, China) ③(University of Chinese Academy of Sciences, Beijing 100049, China)
X-band pulsed space Traveling Wave Tube (TWT) is mainly used in such radar system as light-weight SAR, which is required to have high power, high efficiency and high reliability. The output structure is an important part of the TWT, and its reliability not only affects the output power of TWT, but also influences the stability and reliability of the TWT. In this paper, the reliability of the output structure of an X-band pulsed space TWT is studied. The thermal and structural reliability is studied by means of multi-physics coupling including electrical and magnetic. The shock resistance ability of the output structure is improved according to the analysis results. Furthermore, in the course of above 1000 hours aging and space environmental test, the output structure has high reliability, meeting the space environment test and use requirements.
尚新文,李鑫伟,曹林林,肖刘,苏小保. X波段脉冲空间行波管输出结构可靠性研究[J]. 电子与信息学报, 2016, 38(10): 2674-2680.
SHANG Xinwen,LI Xinwei, CAO Linlin, XIAO Liu, SU Xiaobao. Study of the Reliability of the Output Structure for X-band Space Traveling Wave Tube. JEIT, 2016, 38(10): 2674-2680.
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