In order to reduce test data and test time, a test data compression method for multiple scan chain which bases on mirror-symmetrical reference slices is proposed. This method uses two mutually mirror-symmetrical reference slices for compatibility comparison with scan slice, that improves the compression ratio. If the scan slice is compatible to one of the reference slices, only a few bits are needed to encode it and can be loaded in parallel. Otherwise, the scan slice will replace one reference slice. A longest compatibility strategy is proposed when the scan slice and reference slice satisfy more compatible relationship. It can further improve the test compression ratio to determine the code word according to the different compatibility frequency statistics situations. The experimental results show that the average compression rate of the proposed scheme reaches 69.13%.
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