ABCD Modeling of Crosstalk Coupling Noise of Interconnects
Du Xiao-ming①; Zhao Feng-jun①; Wu Ding-yun②;Zhang-le①
①Institute of Electronics, Chinese Academy of Science, Beijing 100190, China; ②Physical and Electronical Engineering of Zhoukou Normal School, Zhoukou 466000, China
Abstract:Coupling capacitance and mutual inductance are important factors of crosstalk losses in high frequency. ABCD models with improper mutual inductance description have been reported to be used to obtain step response of coupling interconnects . In this paper, a more accurate ABCD model with modified mutual inductance is introduced. Finally, crosstalk coupling noise of interconnects in LTCC technology is analyzed using ADS simulation to verify the improved ABCD model.