电子与信息学报  2001, Vol. 23 Issue (5): 485-490 DOI: |
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| 利用扫描力显微镜测量表面静电势 | ||||
| 张兆祥; 赵兴钰; 侯士敏; 薛增泉 | ||||
| 北京大学电子学系,北京,100871 | ||||
| MEASURMENT OF SURFACE ELECTROSTATIC POTANTIAL USING SCANNING FORCE MICROSCOPY | ||||
| Zhang Zhaoxiang; Zhao Xingyu; Hou Shimin; Xue Zengquan | ||||
| Department of Electronics Peking University Beijing 100871 China |
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