Abstract：A coupling technique is proposed based on parametric yield’s centering design and tolerance optimization. The technique is convergence to the optimal normal values from given initial design variable and tolerance with little knowledge of circuit, device or technology. In the optimal value, the maximum yield can be obtained according to technology condition while proper technology conditions can be chosen according to practical requirements. Finally, the feasibility and utility of the method are demonstrated satisfactorily by numerical and practical examples.
2005, Vol. 27 
